c15. Reginald Tetteh, Samah Mohamed Saeed, “Analysis of Test Data Tampering Attack on Manufacturing Testing,” 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020, pp. 1-6, doi: 10.1109/DTIS48698.2020.9081029.
c15. Reginald Tetteh, Samah Mohamed Saeed, “Analysis of Test Data Tampering Attack on Manufacturing Testing,” 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2020, pp. 1-6, doi: 10.1109/DTIS48698.2020.9081029.